ASML

Metrology & Inspection (YieldStar / HMI)

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YieldStar optical metrology systems measure focus, dose, and overlay on exposed wafers, while HMI (Hermes Microvision) e-beam systems locate and analyze individual chip defects - together closing the litho control loop that keeps EUV and DUV scanners in spec. The latest YieldStar 10 extends in-line EUV metrology to sub-3nm nodes, and the HMI eP5 is ASML's highest-resolution e-beam system for defect detection and CD metrology.

Latest update Aug 3, 2026

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Current status

The smallest of ASML's four product lines by revenue (~€1B in 2025) but a growing area of R&D investment as shrinking nodes make yield control harder

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Specifications1

2025 metrology & inspection revenue
~€1B

remainder of system sales after EUV, DUV, and Installed Base Management

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